APA Style
Penza, Pietro, Bansal, Vipul K.. (2001).
Measuring market risk with value at risk .
New York:
John Wiley & Sons.
Chicago Style
Penza, Pietro, Bansal, Vipul K..
Measuring market risk with value at risk.
New York:
John Wiley & Sons,
2001.
Printed Material.
MLA Style
Penza, Pietro, Bansal, Vipul K..
Measuring market risk with value at risk.
New York:
John Wiley & Sons,
2001.
Printed Material.
Turabian Style
Penza, Pietro, Bansal, Vipul K..
Measuring market risk with value at risk.
New York:
John Wiley & Sons,
2001.
Printed Material.